Calibration standard for high-resolution X-ray diffraction
SIAL/NIST2000 - NIST® SRM® 2000
Product Type: Chemical
| application(s) | general analytical |
| form | solid |
| grade | certified reference material |
| manufacturer/tradename | NIST® |
| packaging | pkg of 1 block |
| Quality Level | 100  |
| technique(s) | diffraction/scattering: suitable |
| General description: | This Standard Reference Material (SRM) provides the high-resolution X-ray diffraction (HRXRD) community with International System of Units (SI) [1] traceable Si (220) d-spacing in transmission, surface-to-crystal-plane wafer miscut, and surface-to-Si (004) Bragg angle in reflection for our reference wavelength. A unit of SRM 2000 consists of25 mm × 25 mm × 0.725 mm double-polished (100)-oriented, single-crystal Si specimens with a nominal 50 nm Si0.85Ge0.15 epitaxial layer and 25 nm Si cap. These certified values can be used to calibrate HRXRD instrumentation. For more information, please refer to the SDS and COA. SRM 2000_cert  SRM 2000_SDS |
| Legal Information: | NIST is a registered trademark of National Institute of Standards and Technology |
| Legal Information: | SRM is a registered trademark of National Institute of Standards and Technology |
| Other Notes: | Please download a current certificate at nist.gov/SRM for current analytes and certified values. |
| RIDADR | NONH for all modes of transport |
| WGK Germany | WGK 3 |
| Flash Point(F) | Not applicable |
| Flash Point(C) | Not applicable |
| UNSPSC | 41116107 |