Ni/Cr thin film depth profile standard
SIAL/NIST2135C - NIST SRM 2135c
Product Type: Chemical
application(s) | pharmaceutical (small molecule) |
form | solid |
grade | certified reference material |
manufacturer/tradename | NIST® |
packaging | pkg of each |
Quality Level | 100 ![]() |
General description: | This Standard Reference Material (SRM) is intended primarily for calibrating sputtered depth scales and erosion rates in surface analysis. A unit of SRM 2135c consists of nine alternating metal thin-film layers, five layers of pure chromium and four of pure nickel, on a polished silicon (100) substrate. For more information,please refer to the COA and SDS. SRM 2135c_cert ![]() ![]() ![]() ![]() |
Legal Information: | NIST is a registered trademark of National Institute of Standards and Technology |
RIDADR | NONH for all modes of transport |
WGK Germany | WGK 3 |
Flash Point(F) | Not applicable |
Flash Point(C) | Not applicable |
UNSPSC | 41116107 |