Boron implant in silicon standard for calibration of concentration in a depth profile
SIAL/NIST2137 - NIST® SRM® 2137
Product Type: Chemical
application(s) | pharmaceutical (small molecule) |
format | matrix material |
grade | certified reference material |
manufacturer/tradename | NIST® |
packaging | pkg of each |
Quality Level | 100 ![]() |
General description: | This Standard Reference Material (SRM) is intended for use in calibrating the secondary ion response to minor and trace levels of boron in a silicon matrix by the analytical technique of secondary ion mass spectrometry (SIMS). A unit of SRM 2137 consists of a single crystal silicon substrate with a surface rendered disordered by silicon ion implantation. For more information, please refer to the SDS and COA. SRM 2137_cert ![]() ![]() ![]() ![]() |
Legal Information: | NIST is a registered trademark of National Institute of Standards and Technology |
Legal Information: | SRM is a registered trademark of National Institute of Standards and Technology |
RIDADR | NONH for all modes of transport |
WGK Germany | WGK 3 |
Flash Point(F) | Not applicable |
Flash Point(C) | Not applicable |
UNSPSC | 12352200 |