Semiconductor thin film: AlxGa1-xAs epitaxial layers (Al mole fraction x near 0.30)
SIAL/NIST2842 - NIST® SRM® 2842
Product Type: Chemical
| application(s) | semiconductor |
| form | film |
| grade | certified reference material |
| manufacturer/tradename | NIST® |
| packaging | pkg of disk |
| Quality Level | 100 ![]() |
| General description: | SRM 2842_cert ![]() SRM 2842_SDS ![]() |
| Legal Information: | NIST is a registered trademark of National Institute of Standards and Technology |
| Legal Information: | SRM is a registered trademark of National Institute of Standards and Technology |
| Other Notes: | Example analytes are listed below as a reference. Please download a current certificate at nist.gov/SRM for current analytes and certified values. Aluminum (Al) See certificate for values and more details at nist.gov/SRM. |
| RIDADR | NONH for all modes of transport |
| WGK Germany | WGK 3 |
| Flash Point(F) | Not applicable |
| Flash Point(C) | Not applicable |
| UNSPSC | 41116107 |

