Scanning electron microscope scale calibration artifact
SIAL/NISTRM8820 - NIST® RM 8820
Product Type: Chemical
| application(s) | semiconductor |
| form | chips |
| grade | certified reference material |
| manufacturer/tradename | NIST® |
| Quality Level | 100  |
| technique(s) | electron microscopy: suitable |
| General description: | SRM 8820_cert  SRM 8820_SDS |
| Legal Information: | NIST is a registered trademark of National Institute of Standards and Technology |
| Other Notes: | Example analytes are listed below as a reference. Please download a current certificate at nist.gov/SRM for current analytes and certified values. Silicon (Si) See certificate for values and more details at nist.gov/SRM. |
| RIDADR | NONH for all modes of transport |
| WGK Germany | WGK 3 |
| Flash Point(F) | Not applicable |
| Flash Point(C) | Not applicable |
| UNSPSC | 41116107 |